Why the Blind Spot and How to Uncover It
Citation analysis has been routinely used for several decades to help assess patent quality and determine how patents impact the competition and affect the world at large.
In Part 1 of this series, we looked at finding citations against both patents and applications, and understanding the limitations of just querying the USPTO. In Part 2 we will discuss the blind spot, and how to uncover it.
Highlights of this white paper include:
- Multiple-Discovery of Patent Inventions
- How to Use Expanded and Timely Citation Data